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K6.6 - Station for high-precision X-ray optics (HPXO)
Methods: high-precision X-ray diffraction, diffraction topography, high-precision X-ray reflectometry, phase analysis, X-ray standing wave method, multiwave diffraction, etc. Samples: almost perfect crystals, surface layers, thin films and boundaries, organic and inorganic multi-layer structures, semi-conductor superlattices and nanostructures, structures with quantum wells, threads and dots, nanostructures on porous layers, real structure of crystals and crystal defects.
The station equipped with:
Stabilizing systems of the spatial position of the SR beam (accuracy ~ 10 µm) and the angular position of the second monochromator crystal (accuracy ~ 0.03 second of arc) provide necessary conditions for carrying out precision X-ray diffractional experiments. The station automatization system provides remote control of all units and mechanisms through the high-speed communication channels and flexible control of one-, two- and three-dimentional measurments. Address: 1 Academic Kurchatov sq., |