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K4.6 - Station for X-ray crystallography and materials science (XCMS)The station is dedicated for precision X-ray diffraction and topography studies in the field of materials science.  Methods: three-crystal diffractometry, dispersion-free plane-wave topography, three-crystal topography, sample deformation mapping, etc. Systems under investigations: structural defects (dislocations, microdefects, second phase inclusions), heterogeneity of foreign atoms distribution, small local deformations of lattice, size and misorientation of crystal blocks, parameters of heteroepitaxial structures, structural changes in real-time scale, etc.
Parameters
The vacuum double-crystal monochromator provides beam energy range from 3 to 40 keV and possibility for continuous scanning through energy interval from 1 to 2 keV. The goniometer with three independent units allows to form the beam with necessary angular and spectral divergence. Address: 1 Academic Kurchatov sq., |
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