K1.6 - Station for X-ray topography and tomography (XTOP)

The station is dedicated for "in situ" researches of dynamics of real crystal structure (getting topograms) in "white" spectrum synchrotron radiation under the influence of low temperatures, electric and magnetic fields, ultrasonic vibrations and others; getting topograms in monochromatic beam in wide range of wavelengths; getting morphologic images of crystal boundary; carrying out absorbing tomographic researches with the use of "white" SR beam with the aperture at the output up to 100×10 mm²; carrying out absorbing tomographic researches with the use of monochromatic radiation with the ability of tuning in wide range of wavelengths.

Methods: projection diffraction topography, section diffraction topography, linearly wave diffraction topography, absorption tomography, phase-contrast tomography.

Samples: structure of real crystals, defects in crystals. Development of topographic methods for synthesis of crystals for the needs of technology. Study of focusing and dispersive elements for X-ray optics and spectroscopy.

The station equipped with:

• evacuation and diagnostics unit - connects the channel outlet with the pumping system, equipped with flanged and bellows nodes for connection of devices for vacuum diagnostics of channel;
• collimation unit - designed for vacuum isolation of the initial part of the channel and for primary collimation of SR-beam, equipped with the water cooling system;
• beam position sensor - phosphor probe with observation video camera;
• double crystal monochromator of SR - output beam energy range from 2 to 38 keV.

Basic goniometer consists of the two-circle goniometer and the rotation stage. Goniometer with the horizontal coaxial axis provides platform turning in the range of ±180° and console tuning in the range of 200°. The topographic device is set on the platform. Various detectors are placed on the console. The tomographic device is set on the rotary table. Goniometer construction allows using the environment devices up to 20 kg weight for variation of temperature, magnetic field, load etc.

The integration of the unique SR characteristics and abilities of X-ray topography and tomography in the single research complex allows to realize the integrated surface research on basis of SR, real and internal structure of wide range of materials - starting with almost perfect crystals and multi-layer organic and inorganic structures up to high-temperature superconductors and fuel elements of nuclear reactors.

Localization of defects in the crystal of high-temperature superconductor Nd_2-xCe_xCuO_4-y using the method of projection diffraction topography.

Address: 1 Academic Kurchatov sq.,
Moscow, 123182, Russian Federation
RRC "Kurchatov Institute", KCSRNT
Phone: +7 (499) 196-75-38, 196-71-10
Fax: +7 (499) 196-77-23
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