K1.5 - Station for X-ray structural analysis (XRSA)

The station is dedicated for research of the atomic structure, distribution of the electron density in the single crystals of inorganic compounds, nanocrystals, clusters, as well as organic compounds with small molecules, polycrystalline and amorphous materials.

The X-ray-diffraction experimental data being obtained allows to reveal regular ties between the structure of crystals and their physical properties (ferroelectricity, piezoelectricity, high-temperature superconductivity, ionic conduction, magnetic properties and others), to research the character of structural phase transfers, including crystals with formation of modulated phases.

• SR-beam divergency in horizontal plane - up to 4,0 mrad;
• Size of the focused beam at the sample - 1,5 õ 1 mm;
• Wavelength range 0,6–2,5 Å, resolution Dl/l = 10^-3;
• Reflection of beam from the focusing segmented mirror is used for suppression of higher orders of diffraction;
• Angular precision of axes j, w, 2q – 10 seconds of arc;
• Sample temperature from ambient up to 100 K.

X-ray optical scheme

The use of SR allows to:

• Decrease the time of experiment,
• Increase precision of measuring of diffraction intensity,
• Increase resolution,
• Decrease sample size,
• Use methods, based on anomalous dispersion.

Address: 1 Academic Kurchatov sq.,
Moscow, 123182, Russian Federation
RRC "Kurchatov Institute", KCSRNT
Phone: +7 (499) 196-75-38, 196-71-10
Fax: +7 (499) 196-77-23
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